Kinematical calculations of RHEED intensity oscillations during the growth of thin epitaxial films

Computer Physics Communications

Volumn 170, Issue 3, 2005, Pages 265-286

  Daniluk, Andrzej ^a  

^a MARIA CURIE SK ODOWSKA UNIVERSITY   (Poland)

Author keywords

Computer simulations; Molecular Beam Epitaxy (MBE); Non linear differential equations; Reflection high energy electron diffraction (RHEED); Unified Modeling Language (UML)

Indexed keywords

ALGORITHMS; COMPUTER PROGRAMMING LANGUAGES; COMPUTER SIMULATION; EPITAXIAL GROWTH; FILM GROWTH; KINEMATICS; MATHEMATICAL MODELS; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;

COMPUTING ALGORITHMS; GROWTH PROCESS; NON-LINEAR DIFFERENTIAL EQUATIONS; UNIFIED MODELING LANGUAGE (UML);

THIN FILMS;

EID: 22644440946     PISSN: 00104655     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cpc.2005.04.005     Document Type: Article

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