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Volumn 57, Issue 19, 1998, Pages 12443-12447

RHEED intensity oscillations observed during the growth of on Si(111)

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Indexed keywords


EID: 0001410458     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.57.12443     Document Type: Article
Times cited : (10)

References (24)
  • 13
    • 0042714478 scopus 로고
    • see also RHEED and Reflection Electron Imaging of Surfaces, edited by P. K. Larsen and P. J. Dobson (Plenum, New York, 1988)
    • J. J. Harris, B. A. Joyce, and P. J. Dobson, Surf. Sci. 139, 121 (1984); see also RHEED and Reflection Electron Imaging of Surfaces, edited by P. K. Larsen and P. J. Dobson (Plenum, New York, 1988).
    • (1984) Surf. Sci. , vol.139 , pp. 121
    • Harris, J.1    Joyce, B.2    Dobson, P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.