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Volumn 28, Issue 8, 2005, Pages 735-742

Micromechanical testing of SU-8 cantilevers

Author keywords

AFM cantilevers; Microscale mechanical test; SU 8; Surface profliometer; Young's modulus

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; MECHANICAL PROPERTIES; MECHANICAL TESTING; MICROELECTROMECHANICAL DEVICES; OPTICAL MICROSCOPY; PROFILOMETRY;

EID: 22544473613     PISSN: 8756758X     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1460-2695.2005.00873.x     Document Type: Article
Times cited : (96)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.