Magnetic resonance electrical impedance tomography (MREIT): Conductivity and current density imaging

Journal of Physics: Conference Series

Volumn 12, Issue 1, 2005, Pages 140-155

  Seo, Jin Keun ^a   Kwon, Ohin ^a   Woo, Eung Je ^b  

^a Yonsei University   (South Korea)

^b Kyung Hee University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22544455057     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/12/1/014     Document Type: Conference Paper

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