Optical properties of InGaAs alloy films in the E2 region by spectroscopic ellipsometry

Journal of the Korean Physical Society

Volumn 42, Issue SPEC., 2003, Pages

  Ihn, Y S ^a   Ghong, T H ^a   Kim, Y D ^a   Kim, S J ^b   Aspnes, D E ^b   Yao, T ^c   Koo, B H ^d  

^a Kyung Hee University   (South Korea)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c TOHOKU UNIVERSITY   (Japan)

^d Changwon National University   (South Korea)

Author keywords

Band gap; Ellipsometry; InGaAs alloy

Indexed keywords

EID: 0037306670     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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