Fabrication and measurement of tall stacked arrays of SNS Josephson junctions

IEEE Transactions on Applied Superconductivity

Volumn 15, Issue 2 PART I, 2005, Pages 110-113

  Hadacek, Nicolas ^a   Dresselhaus, P D ^a   Chong, Y ^a   Benz, S P ^a   Bonevich, J E ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Josephson junction; Lumped array; MoSi2; Multilayer; Voltage standard

Indexed keywords

CRITICAL CURRENTS; ELECTRIC POTENTIAL; ELECTRODES; INDUCTIVELY COUPLED PLASMA; IRRADIATION; MICROMETERS; MOLYBDENUM COMPOUNDS; MULTILAYERS; PLASMA ETCHING; THIN FILMS;

LUMPED ARRAYS; MOSI2; TALL STACKED ARRAYS; VOLTAGE STANDARDS;

JOSEPHSON JUNCTION DEVICES;

EID: 22044442162     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2005.849706     Document Type: Conference Paper

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