Critical current control and microwave-induced characteristics of (NbN/TiNx)N/NbN stacked junction arrays

IEEE Transactions on Applied Superconductivity

Volumn 13, Issue 2 I, 2003, Pages 1093-1095

  Ishizaki, M ^a   Yamamori, H ^a   Shoji, A ^a   Benz, S P ^b   Dresselhaus, P D ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Digital to analog converter; Josephson junction; Sputtering; Stacked junctions; Voltage standard

Indexed keywords

CRITICAL CURRENTS; DIGITAL TO ANALOG CONVERSION; ELECTRIC POTENTIAL; ELECTRODES; SPUTTERING;

STACKED JUNCTIONS;

JOSEPHSON JUNCTION DEVICES;

EID: 0042440802     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2003.814163     Document Type: Conference Paper

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