Nanofabricated SNS junction series arrays in superconductor-normal metal bilayers

Superconductor Science and Technology

Volumn 14, Issue 12, 2001, Pages 1086-1089

  Hadfield, Robert H ^a   Burnell, Gavin ^a   Kang, Dae Joon ^a   Blamire, Mark G ^a   Dresselhaus, Paul ^b   Benz, Samuel P ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARRAYS; CURRENT VOLTAGE CHARACTERISTICS; MULTILAYERS; NANOTECHNOLOGY; SUPERCONDUCTING TRANSITION TEMPERATURE;

ELECTROMAGNETIC COUPLING; METAL BILAYERS;

JOSEPHSON JUNCTION DEVICES;

EID: 0035662259     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/14/12/322     Document Type: Article

References (14)

1. Optimum characteristics of high temperature Josephson junctions for 'lumped' array applications
2. Nanotechnology for the next generation of Josephson voltage standards
3. Direct writing of low Tc superconductor-normal metal-superconductor junctions using a focused ion beam
4. Nanoscale SNS junction fabrication in superconductor-normal metal bilayers
5. Real time resistometric depth monitoring in the focused ion beam
6. Mutual phase-locking in Josephson junction arrays
7. Shunted bicrystal Josephson junction arrays for voltage standards