High-energy X-ray diffraction and topography investigation of CdZnTe

Journal of Electronic Materials

Volumn 34, Issue 6, 2005, Pages 804-810

  Carini, G A ^a,b   Camarda, G S ^a   Zhong, Z ^a   Siddons, D P ^a   Bolotnikov, A E ^a   Wright, G W ^a   Barber, B ^c   Arnone, C ^b   James, R B ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF PALERMO   (Italy)

^c UNIVERSITY OF ARIZONA   (United States)

Author keywords

Crystal quality; CZT; Detectors characterization; High energy x ray diffraction; Rocking curve; Topography

Indexed keywords

CRYSTAL STRUCTURE; DETECTORS; ELECTRIC FIELD EFFECTS; GAMMA RAYS; HIGH ENERGY ELECTRON DIFFRACTION; INFRARED RADIATION; NONDESTRUCTIVE EXAMINATION; SINGLE CRYSTALS; SPECTRUM ANALYSIS; SURFACE TOPOGRAPHY; X RAY DIFFRACTION ANALYSIS;

CRYSTAL QUALITY; CZT; DETECTORS CHARACTERIZATION; HIGH-ENERGY X-RAY DIFFRACTION; ROCKIG CURVE; TOPOGRAPHY;

CADMIUM COMPOUNDS;

EID: 21744439436     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-005-0024-6     Document Type: Conference Paper

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