Determination of deep and shallow levels in conjugated polymers by electrical methods

Physica B: Condensed Matter

Volumn 273-274, Issue , 1999, Pages 923-926

  Stallinga, Peter ^a   Gomes, Henrique L ^a   Rost, H ^b   Holmes, A B ^b   Harrison, M G ^c   Friend, R H ^c   Biscarini, F ^d   Taliani, C ^d   Jones, G W ^e   Taylor, D M ^e  

^a UNIVERSITY OF ALGARVE   (Portugal)

^b Melville Laboratory for Polymer Synthesis   (United Kingdom)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^d CNR   (Italy)

^e BANGOR UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; HOLE TRAPS; SPECTROSCOPIC ANALYSIS;

ADMITTANCE SPECTROSCOPY; DEEP TRAPS; SHALLOW LEVELS;

SEMICONDUCTING POLYMERS;

EID: 0033348792     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00555-4     Document Type: Article

References (5)

1. P. Stallinga et al., J. Appl. Phys. (1999) submitted for publication.
2. P. Stallinga et al., Acta Phys. Polonica A 94 (1998) 545.
3. P. Stallinga et al., Proceedings of the ICSM 1998 Conference in Montpellier.
4. Toshio Misawa, J. Phys. Soc. Japan 12 (1957) 882.
5. H.L. Gomes et al., Appl. Phys. Lett. 74 (1999) 1144.