Self-assembled monolayer molecular devices

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2004, Pages 531-532

  Wang, Wenyong ^a   Lee, Takhee ^a   Kretzschmar, Ilona ^a   Routenberg, David ^a   Reed, Mark A ^a  

^a YALE UNIVERSITY   (United States)

Author keywords

Molecular electronics; Nanotechnology

Indexed keywords

ALKANETHIOL; BAND OFFSETS; MOLECULAR DEVICES; MOLECULAR ELECTRONICS; BAND-OFFSET; CONTROL STANDARDS; MOLECULAR DEVICE; NANO SCALE; PEAK INTENSITY; PEAK WIDTHS; RECENT PROGRESS;

ALCOHOLS; ELECTRON TUNNELING; MOLECULAR PHYSICS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; SENSITIVITY ANALYSIS; SUBSTITUTION REACTIONS; MOLECULAR ELECTRONICS; SELF ASSEMBLED MONOLAYERS;

SELF ASSEMBLY; NANOTECHNOLOGY;

EID: 21644485589     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)

1. Reed, M. A.; Tour, J. M. Scientific American 2000, June 86-93.
2. Reed, M. A.; Zhou, C.; Muller, C. J.; Burgin, T. P.; Tour, J. M. Science 1997, 275, 252-254.
3. Reed, M. A.; Lee, T. Eds. Molecular Nanoelectronics; American Scientific Publishers: Stevenson Ranch, 2003.
4. (a) Heath, J. R.; Ratner, M. A. Physics Today 2003, May 43-49.
5. (b) Nitzan, A.; Ratner, M. A. Science 2003, 300, 1384-1389.
6. (a) Chen, Y.; Jung, G.-Y.; Ohlberg, D. A. A.; Li, X.; Stewart, D. R.; Jeppesen, J. O.; Nielsen, K. A.; Stoddart, J. F.; Williams, R. S. Nanotechnology, 2003, 14, 462-468.
7. (b) Beyond Silicon: Breakthroughs in Molecular Electronics, http://www.hpl.hp.com/research/qsr/(Hewlett-Packard Quantum Science Research)
8. (a) Luo, Y.; Collier, C. P.; Jeppesen, J. O.; Nielsen, K. A.; Delonno, E.; Ho, G.; Perkins, J.; Tseng, H-R.; Yamamoto, T.; Stoddart, J. F.; Heath, J. R. Chem. Phys. Chem. 2002, 3, 519-525.
9. (b) Collier, C. P.; Mattersteig, G.; Wong, E. W.; Luo, Y.; Beverly, K.; Sampaio, J.; Raymo, F. M.; Stoddart, J. P.; Heath, J. R. Science 2000, 289, 1172-1175.
10. (a) Stewart, D. R.; Ohlberg, D. A. A.; Beck, P. A.; Chen, Y.; Williams, R. S.; Jeppesen, J. O.; Nielsen, K. A.; Stoddart, J. F. Nano Lett 2004, 4, 133-136.
11. (b) Lau, C. N.; Stewart, D. R.; Williams, R. S.; Bockrath, M. Nano Lett. 2004, 4, 569-572.
12. Lee, T.; Wang, W.; Klemic, J. F.; Zhang, J. J.; Su, J.; Reed, M. A. J. Phys. Chem. B 2004, 108, 8742-8750.
13. Ulman, A. An Introduction to Ultrathin Organic Films from Langmuir-Blodgett to Self-Assembly; Academic Press: Boston, 1991.
14. Wang, W.; Lee, T.; Reed, M. A. Phys. Rev. B 2003, 68, 035416.
15. For Raman data see, for example: Bryant, M. A.; Pemberton, J. E. J. Am. Chem. Soc. 1991, 113, 8284.
16. For HREELS data see, for example: Kato, H. S.; Noh, J.; Hara, M.; Kawai, M. J. Phys. Chem. B 2002, 106, 9655.
17. For IR data see, for example: Castiglioni, C.; Gussoni, M.; Zerbi, G. J. Chem. Phys. 1991, 95, 7144.
18. The symbols 8, γ, and v denote in-plane rocking (r) and scissoring (s), out-of-plane wagging (w) and twisting (t), and stretching modes, respectively.