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Volumn 97, Issue 12, 2005, Pages
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Breakdown of ultrathin native oxide films at contact interfaces of electromechanically stressed silicon microdevices
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Author keywords
[No Author keywords available]
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Indexed keywords
CONTACT INTERFACES;
SILICON MICRODEVICES;
SILICON OXIDE FILMS;
ULTRATHIN NATIVE OXIDE FILMS;
ELECTRIC BREAKDOWN;
ELECTRIC POTENTIAL;
ELECTROMECHANICAL DEVICES;
INTERFACES (MATERIALS);
POLYSILICON;
SEMICONDUCTOR DEVICES;
STRESSES;
ULTRATHIN FILMS;
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EID: 21644469716
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1941467 Document Type: Article |
Times cited : (8)
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References (16)
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