메뉴 건너뛰기




Volumn 97, Issue 12, 2005, Pages

Breakdown of ultrathin native oxide films at contact interfaces of electromechanically stressed silicon microdevices

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT INTERFACES; SILICON MICRODEVICES; SILICON OXIDE FILMS; ULTRATHIN NATIVE OXIDE FILMS;

EID: 21644469716     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1941467     Document Type: Article
Times cited : (8)

References (16)
  • 9
    • 21644435376 scopus 로고    scopus 로고
    • Technical Digest, Solid-State Sensor, Actuator and Microsystems Workshop, Hilton Head Island, South Carolina, 6-10 June
    • L. Kogut, A. Lumbantobing, and K. Komvopoulos, in Technical Digest, Solid-State Sensor, Actuator and Microsystems Workshop, Hilton Head Island, South Carolina, 6-10 June, 2004, p. 310.
    • (2004) , pp. 310
    • Kogut, L.1    Lumbantobing, A.2    Komvopoulos, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.