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Volumn 2, Issue , 2004, Pages 1359-1362

Visualization of in- And out-of-plane vibrations in a micromechanical RF-resonator

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FINITE ELEMENT METHOD; IMAGING TECHNIQUES; LASER BEAMS; MATHEMATICAL MODELS; MICROELECTROMECHANICAL DEVICES; NATURAL FREQUENCIES; ULTRASONIC TRANSDUCERS;

EID: 21644465892     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (6)
  • 1
    • 1942424160 scopus 로고    scopus 로고
    • Squareextensional mode single-crystal silicon micromechanical resonator for low phase noise oscillator applications
    • Kaajakari, T. Mattila, A. Oja, J. Kiihamäki, and H. Seppä, "Squareextensional mode single-crystal silicon micromechanical resonator for low phase noise oscillator applications," IEEE Electron Dev. Lett., vol. 25, no. 4, pp. 173-175, 2004.
    • (2004) IEEE Electron Dev. Lett. , vol.25 , Issue.4 , pp. 173-175
    • Kaajakari1    Mattila, T.2    Oja, A.3    Kiihamäki, J.4    Seppä, H.5
  • 3
    • 0036557930 scopus 로고    scopus 로고
    • Characterization of MEMS transducer performance using near-field scanning interferometry
    • J. L. Blackshire and S. Sathish, "Characterization of MEMS transducer performance using near-field scanning interferometry," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 49, no. 5, pp. 669-674, 2002.
    • (2002) IEEE Trans. Ultrason., Ferroelect., Freq. Contr. , vol.49 , Issue.5 , pp. 669-674
    • Blackshire, J.L.1    Sathish, S.2
  • 4
    • 0035423968 scopus 로고    scopus 로고
    • 3D measurement of micromechanical devices vibration mode shapes with a stroboscopic interferometric microscope
    • S. Petitgrand, R. Yahiaoui, K. Danaie, A. Bosseboeuf, and J. Gilles, "3D measurement of micromechanical devices vibration mode shapes with a stroboscopic interferometric microscope," Opt. Lasers Eng., vol. 36, pp. 77-101, 2001.
    • (2001) Opt. Lasers Eng. , vol.36 , pp. 77-101
    • Petitgrand, S.1    Yahiaoui, R.2    Danaie, K.3    Bosseboeuf, A.4    Gilles, J.5
  • 5
    • 0036772740 scopus 로고    scopus 로고
    • Measurement system for full three-dimensional motion characterization of MEMS
    • C. Rembe and R. S. Muller, "Measurement system for full three-dimensional motion characterization of MEMS," J. Microelectromech. Syst., vol. 11, no. 5, pp. 479-488, 2002.
    • (2002) J. Microelectromech. Syst. , vol.11 , Issue.5 , pp. 479-488
    • Rembe, C.1    Muller, R.S.2
  • 6
    • 0001736550 scopus 로고    scopus 로고
    • Scanning Michelson interferometer for imaging surface acoustic wave fields
    • J. V. Knuuttila, P. T. Tikka, and M. M. Salomaa, "Scanning Michelson interferometer for imaging surface acoustic wave fields," Opt. Lett., vol. 25, pp. 613-615, 2000.
    • (2000) Opt. Lett. , vol.25 , pp. 613-615
    • Knuuttila, J.V.1    Tikka, P.T.2    Salomaa, M.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.