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Volumn 14, Issue 6, 1998, Pages 393-401

Ways to improve the analysis of multi-level accelerated life testing

Author keywords

Accelerated life testing; MEOST; Non linear acceleration models; Step stress testing

Indexed keywords

EQUIPMENT TESTING; FAILURE ANALYSIS; LIFE CYCLE; STRESS ANALYSIS;

EID: 0032201834     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1099-1638(199811/12)14:6<393::aid-qre223>3.0.co;2-u     Document Type: Article
Times cited : (9)

References (9)
  • 3
    • 11744356868 scopus 로고
    • Multiple environment overstress testing for automotive electronics reliability - A Dorian Shainin methodology
    • K. Bhote, 'Multiple environment overstress testing for automotive electronics reliability - a Dorian Shainin methodology', Trans. Am. Soc. Met., 237-243 (1985).
    • (1985) Trans. Am. Soc. Met. , pp. 237-243
    • Bhote, K.1
  • 7
    • 0024891878 scopus 로고
    • Optimum simple step-stress accelerated Life tests with censoring
    • D. S. Bai, M. S. Kim and S. H. Lee, 'Optimum simple step-stress accelerated Life tests with censoring', IEEE Trans. Reliab., REL-38, 528-532 (1989).
    • (1989) IEEE Trans. Reliab. , vol.REL-38 , pp. 528-532
    • Bai, D.S.1    Kim, M.S.2    Lee, S.H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.