An alternative to the Weibull step-stress model

International Journal of Quality and Reliability Management

Volumn 16, Issue 2, 1999, Pages 158-165

  Khamis, Imad H ^a   Higgins, James J ^b  

^a UNIVERSITY OF MISSOURI   (United States)

^b KANSAS STATE UNIVERSITY   (United States)

Author keywords

Models; Product testing; Reliability; Tests

Indexed keywords

EID: 21644460115     PISSN: 0265671X     EISSN: None     Source Type: Journal    
DOI: 10.1108/02656719910249883     Document Type: Article

References (4)

1. Bai, D.S., Kim, M.S., Lee, S.H. (1989), "Optimum simple step-stress acceleraated lif tests with censsoring" in IEEE Transactions on Reliability, Vol. 38, No. 5, pp. 5528-32.
2. Miller, R., Nelson,W.B. (1983), "Optimum simple step-stress plans for accelerated life tesing" in IEEE Transactions on Reliability, Vol. R-32, pp. 59-65.
3. Nelson, W.B. (1980), "Accelerated life testing step-stress models and data analysis" in IEEE Transactions on Reliability, pp. 103-8.
4. Nelson,W.B. (1990), Accelerated Testing, Statistical Models, Test Plans and Data Analysis, Wiley, New York, NY.