Electric-field dependence of negative-bias temperature instability

Journal of Applied Physics

Volumn 97, Issue 8, 2005, Pages

  Ushio, Jiro ^a   Okuyama, Yutaka ^a   Maruizumi, Takuya ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC INTERFACES; ELECTRIC FIELD DEPENDENCE; HYDROGEN MIGRATION; NEGATIVE-BIAS TEMPERATURE INSTABILITY (NBTI);

ACTIVATION ENERGY; CMOS INTEGRATED CIRCUITS; CRYSTAL LATTICES; DIELECTRIC DEVICES; DISSOCIATION; ELECTRIC FIELDS; REACTION KINETICS; TEMPERATURE DISTRIBUTION;

ELECTRIC FIELD EFFECTS;

EID: 21444434901     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1866493     Document Type: Article

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