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Volumn 5343, Issue , 2004, Pages 45-54

MEMS Characterization using New Hybrid Laser Doppler Vibrometer / Strobe Video System

Author keywords

Characterization; Laser Doppler vibrometer; Machine vision; Mechanical; MEMS; Microscopic; Vibration

Indexed keywords

LASER DOPPLER VIBROMETERS (LDV); MICRO MOTION ANALYSIS (MMA); MICRO SCANNING VIBROMETERS (MSV); PICOMETERS;

EID: 2142825324     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.524565     Document Type: Conference Paper
Times cited : (21)

References (9)
  • 1
    • 0038397377 scopus 로고    scopus 로고
    • MEMS Characterization using Laser Doppler Vibrometry
    • Reliability, Testing and Characterization of MEMS/MOEMS II, January
    • Eric M. Lawrence, Kevin E. Speller, "MEMS Characterization using Laser Doppler Vibrometry", Reliability, Testing and Characterization of MEMS/MOEMS II, SPIE Proceedings Vol. 4980, January, 2002.
    • (2002) SPIE Proceedings , vol.4980
    • Lawrence, E.M.1    Speller, K.E.2
  • 2
    • 0038111002 scopus 로고    scopus 로고
    • LDV Measurements in MEMS: A sampling of capability
    • San Diego, March 22
    • Turner, Kimberly, "LDV Measurements in MEMS: A sampling of capability", Proceedings of 2002 PSV User's Meeting, San Diego, March 22, 2002.
    • (2002) Proceedings of 2002 PSV User's Meeting
    • Turner, K.1
  • 6
    • 0037721313 scopus 로고    scopus 로고
    • Resonant frequency method for monitoring MEMS fabrication
    • Reliability, Testing and Characterization of MEMS/MOEMS II, January
    • Danelle M. Tanner, Albert C. Owen, Jr., Fredd Rodriquez, "Resonant frequency method for monitoring MEMS fabrication", Reliability, Testing and Characterization of MEMS/MOEMS II, SPIE Proceedings Vol. 4980, January, 2002.
    • (2002) SPIE Proceedings , vol.4980
    • Tanner, D.M.1    Owen Jr., A.C.2    Rodriquez, F.3
  • 7
    • 0038058955 scopus 로고    scopus 로고
    • Anodic Oxidation-Induced Delamination of the SUMMIT Polyt 0 to Silicon Nitride Interface
    • Reliability, Testing and Characterization o/MEMS/MOEMS II, January
    • Richard Plass, Jeremy A. Walraven, Danelle M. Tanner, and Fredrick W. Sexton, "Anodic Oxidation-Induced Delamination of the SUMMIT Polyt 0 to Silicon Nitride Interface", Reliability, Testing and Characterization o/MEMS/MOEMS II, SPIE Proceedings Vol. 4980, January, 2002.
    • (2002) SPIE Proceedings , vol.4980
    • Plass, R.1    Walraven, J.A.2    Tanner, D.M.3    Sexton, F.W.4
  • 8
    • 0000871675 scopus 로고    scopus 로고
    • Viscous drag measurements utilizing microfabricated cantilevers
    • June
    • P. Oden, G. Chen, R. Steele, R. Warmack, and T. Thundat, "Viscous drag measurements utilizing microfabricated cantilevers", Applied Physics Letters, Volume 68/Number 24, June 1996.
    • (1996) Applied Physics Letters , vol.68 , Issue.24
    • Oden, P.1    Chen, G.2    Steele, R.3    Warmack, R.4    Thundat, T.5
  • 9
    • 0242273242 scopus 로고    scopus 로고
    • Vibroacoustic Effects in MEMS
    • September
    • Roman Vinokur, "Vibroacoustic Effects in MEMS", Sound & Vibration, Volume 37 / Number 9, September 2003.
    • (2003) Sound & Vibration , vol.37 , Issue.9
    • Roman, V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.