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Volumn 17, Issue 4, 2004, Pages 653-656

Investigation of the electrical properties of vertically stacked interface-treated Josephson junctions

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CURRENT DENSITY; DEPOSITION; HEAT CONDUCTION; INTERFACES (MATERIALS); MAGNETIC FIELDS; SEMICONDUCTOR JUNCTIONS; THERMAL EFFECTS;

EID: 2142751162     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/17/4/015     Document Type: Article
Times cited : (3)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.