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EPJ Applied Physics

Volumn 26, Issue 2, 2004, Pages 75-85

Modulated photocurrent to characterize the density of states of thin film semiconductors in the recombination regime

(3) Gueunier, M E a Longeaud, C a Kleider, J P a

a UNIV PARIS SUD (France)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CARRIER MOBILITY; CHARGE CARRIERS; COMPUTER SIMULATION; ELECTRON TRAPS; FERMI LEVEL; GLASS; HOLE TRAPS; PHOTOCURRENTS; THIN FILMS;

DENSITY OF STATES; DISORDERED STRUCTURES; GLASSY SOLIDS; MEAN FREE PATHS; MODULATED PHOTO CURRENT TECHNIQUE; RECOMBINATION OF CARRIERS; TRAPPING;

SEMICONDUCTING FILMS;

EID: 2142654270 PISSN: 12860042 EISSN: None Source Type: Journal
DOI: 10.1051/epjap:2004025 Document Type: Article

Times cited : (13)

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