SCOPUS 정보 검색 플랫폼

Solid State Communications

Volumn 130, Issue 10, 2004, Pages 675-680

Annular dark field imaging in a TEM

(5) Bals, S a Kabius, B b Haider, M c Radmilovic, V a Kisielowski, C a

a LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

b ARGONNE NATIONAL LABORATORY (United States)

c CEOS GmbH (Germany)

Author keywords

E. Dark field TEM; E. Z contrast

Indexed keywords

ABERRATIONS; BRAGG CELLS; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; ELECTRON DIFFRACTION; ELECTRON SCATTERING; ION BEAMS; OPTICAL INSTRUMENT LENSES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ANNULAR DARK FIELD IMAGING; DARK FIELD TEM; HIGH ANGLE ANNULAR DARK FIELD IMAGES (HAADF); RUTHERFORD SCATTERING; SCANNING TRANSMISSION ELECTRON MICROSCOPES (STEM); Z-CONTRAST;

IMAGE PROCESSING;

EID: 2142640861 PISSN: 00381098 EISSN: None Source Type: Journal
DOI: 10.1016/j.ssc.2004.03.035 Document Type: Article

Times cited : (51)

References (15)

1
- 33845349825
- Heinemann K., Poppa H. Appl. Phys. Lett. 20:1972;122.
- (1972) Appl. Phys. Lett. , vol.20 , pp. 122
- Heinemann, K.¹ Poppa, H.²

2
- 0035831838
- Williamson M.J., Dunn D.N., Hull R., Kodambaka S., Petrov I., Greene J.E. Appl. Phys. Lett. 78:2001;2223.
- (2001) Appl. Phys. Lett. , vol.78 , pp. 2223
- Williamson, M.J.¹ Dunn, D.N.² Hull, R.³ Kodambaka, S.⁴ Petrov, I.⁵ Greene, J.E.⁶

3
- 0014171612
- Dupouy G. J Electron Microsc. 16:1967;5.
- (1967) J Electron Microsc , vol.16 , pp. 5
- Dupouy, G.¹

4
- 0003521799
- New York: Plenum Press
- Williams D.B., Carter C.B. Transmission Electron Microscopy. 1996;Plenum Press, New York. p. 359.
- (1996) Transmission Electron Microscopy , pp. 359
- Williams, D.B.¹ Carter, C.B.²

5
- 0037291244
- Kaiser U., Chuvilin A. Microsc Microanal. 9:2003;36.
- (2003) Microsc Microanal , vol.9 , pp. 36
- Kaiser, U.¹ Chuvilin, A.²

6
- 0003985333
- New York: Plenum Press
- Hawkes P.W. Tomography: Three-dimensional Imaging with the Transmission Electron Microscope. 1992;Plenum Press, New York.
- (1992) Tomography: Three-dimensional Imaging with the Transmission Electron Microscope
- Hawkes, P.W.¹

7
- 0042208675
- Manna L., Milliron D.J., Meisel A., Scher E.C., Alivisatos A.P. Nature Mater. 2:2003;382.
- (2003) Nature Mater , vol.2 , pp. 382
- Manna, L.¹ Milliron, D.J.² Meisel, A.³ Scher, E.C.⁴ Alivisatos, A.P.⁵

8
- 2142851247
- Japan: Osaka University. January 20-22
- Kisielowski C., Bals S., Nelson C., Sui H., Downing K.H. Proceedings of International Symposium on the Creation of Novel Nanomaterials. 2004;Osaka University, Japan. January 20-22.
- (2004) Proceedings of International Symposium on the Creation of Novel Nanomaterials
- Kisielowski, C.¹ Bals, S.² Nelson, C.³ Sui, H.⁴ Downing, K.H.⁵

9
- 0026244960
- Lichte H. Ultramicroscopy. 38:1991;13.
- (1991) Ultramicroscopy , vol.38 , pp. 13
- Lichte, H.¹

10
- 0003521799
- New York: Plenum Press
- Williams D.B., Carter C.B. Transmission Electron Microscopy. 1996;Plenum Press, New York. p. 98.
- (1996) Transmission Electron Microscopy , pp. 98
- Williams, D.B.¹ Carter, C.B.²

11
- 0031271221
- Kisielowski C., Liliental-Weber Z., Nakamura S. Jpn. J. Appl. Phys. 36:1997;6932.
- (1997) Jpn. J. Appl. Phys. , vol.36 , pp. 6932
- Kisielowski, C.¹ Liliental-Weber, Z.² Nakamura, S.³

12
- 0003723293
- New York: Wiley
- Heidenreich R.D. Fundamentals of Transmission Electron Microscopy. 1964;Wiley, New York. p. 31.
- (1964) Fundamentals of Transmission Electron Microscopy , pp. 31
- Heidenreich, R.D.¹

13
- 2142687685
- C. Kisielowski, in preparation
- C. Kisielowski, in preparation.

14
- 77957727901
- Nellist P.D., Pennycook S.J. Adv Imaging Electron Phys. 113:2000;147.
- (2000) Adv Imaging Electron Phys , vol.113 , pp. 147
- Nellist, P.D.¹ Pennycook, S.J.²

15
- 2142687200
- S. Bals, C. Kisielowski, in preparation
- S. Bals, C. Kisielowski, in preparation.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.