Practical photoluminescence and photoreflectance spectroscopic system for optical characterization of semiconductor devices

Optics Express

Volumn 13, Issue 11, 2005, Pages 3951-3960

  Ho, Ching Hwa ^a   Huang, Kuo Wei ^a   Lin, Yu Shyan ^a   Lin, Der Yuh ^b  

^a NATIONAL DONG HWA UNIVERSITY   (Taiwan)

^b NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY GAP; HETEROJUNCTION BIPOLAR TRANSISTORS; HIGH ELECTRON MOBILITY TRANSISTORS; LIGHT EMITTING DIODES; LIGHT MODULATION; LIGHT REFLECTION; OPTOELECTRONIC DEVICES; PHOTOLUMINESCENCE; SIGNAL TO NOISE RATIO; SPECTROSCOPIC ANALYSIS;

OPTICAL CHARACTERIZATION; OPTOELECTRONIC MATERIALS; POLARIZED-PHOTOREFLECTANCE (PPR); THERMOREFLECTANCE (TR);

SEMICONDUCTOR DEVICES;

EID: 21244474792     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.003951     Document Type: Article

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