Photoreflectance study of the excitonic transitions of rhenium disulphide layer compounds

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 24, 2002, Pages 2452071-2452075

  Ho, C H ^a   Yen, P C ^b   Huang, Y S ^b   Tiong, K K ^c  

^a NATIONAL DONG HWA UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^c NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DISULFIDE; RHENIUM COMPLEX;

ARTICLE; ELECTRON TRANSPORT; ENERGY; LOW TEMPERATURE; PHASE TRANSITION; POLARIZED PHOTOREFLECTANCE SPECTROSCOPY; QUANTUM MECHANICS; SEMICONDUCTOR; SPECTROSCOPY; TEMPERATURE DEPENDENCE;

EID: 0037116161     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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