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Volumn 6, Issue 2, 2005, Pages 75-79

Visualizing acoustic displacements of capacitive micromachined transducers using an interferometric microscope

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC NOISE; FREQUENCIES; INTERFEROMETRY; LIGHT EMITTING DIODES; LIGHT SOURCES; MICROELECTROMECHANICAL DEVICES; MICROMACHINING; OPTICAL SYSTEMS; PHASE SHIFT; PROFILOMETRY;

EID: 21244465531     PISSN: 15297853     EISSN: None     Source Type: Journal    
DOI: 10.1121/1.1851391     Document Type: Article
Times cited : (15)

References (7)
  • 3
    • 0001585337 scopus 로고    scopus 로고
    • Using a light microscope to measure motions with nanometer accuracy
    • C. Q. Davis and D. M. Freeman, "Using a light microscope to measure motions with nanometer accuracy," Opt. Eng. (Bellingham) 37, 1299-1304 (1998).
    • (1998) Opt. Eng. (Bellingham) , vol.37 , pp. 1299-1304
    • Davis, C.Q.1    Freeman, D.M.2
  • 4
    • 0032661901 scopus 로고    scopus 로고
    • Stroboscopic phase-shifting interferometry for dynamic characterization of optical MEMS
    • M. R. Hart, R. A. Conant, K. Y. Lau, and R. S. Muller, "Stroboscopic phase-shifting interferometry for dynamic characterization of optical MEMS," Proc. SPIE 3749, 468-469 (1999).
    • (1999) Proc. SPIE , vol.3749 , pp. 468-469
    • Hart, M.R.1    Conant, R.A.2    Lau, K.Y.3    Muller, R.S.4
  • 5
    • 0035758325 scopus 로고    scopus 로고
    • Optical measurement methods to study dynamic behaviour in MEMS
    • C. Rembe, R. Kant, and R. S. Muller, "Optical measurement methods to study dynamic behaviour in MEMS," Proc. SPIE 4400, 127-137 (2001).
    • (2001) Proc. SPIE , vol.4400 , pp. 127-137
    • Rembe, C.1    Kant, R.2    Muller, R.S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.