Conducting atomic force microscopy for nanoscale electron emissions from various diamond-like carbon films

Applied Surface Science

Volumn 249, Issue 1-4, 2005, Pages 315-321

  Liu, Dongping ^a,b   Benstetter, Günther ^a  

^a DEGGENDORF INSTITUTE OF TECHNOLOGY   (Germany)

^b Department of Environmental and Radiological Health Sciences   (United States)

Author keywords

Conducting atomic force microscopy; Diamond like carbon; Electron emission

Indexed keywords

CARBON; CHEMICAL VAPOR DEPOSITION; DIAMOND FILMS; ELECTRON EMISSION; ELECTRON TUNNELING; HYDROGENATION; MAGNETRON SPUTTERING; SCANNING ELECTRON MICROSCOPY;

CONDUCTING ATOMIC FORCE MICROSCOPY; ELECTRON FIELD EMISSIONS; FILM STRUCTURES; TUNNELING CURRENTS;

ATOMIC FORCE MICROSCOPY;

EID: 21244458019     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.12.029     Document Type: Article

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