Automatic leather inspection of defective patterns

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2665, Issue , 1996, Pages 108-119

  Tafuri, Maria ^a   Branca, Antonella ^a   Attolico, Giovanni ^a   Distante, Arcangelo ^a   Delaney, William ^a  

^a UNIVERSITY OF BARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTIVE PATTERNS; WRINKLEDNESS;

DEFECTS; FERROMAGNETIC MATERIALS; INDUSTRIAL APPLICATIONS; INSPECTION; LEATHER; MANUFACTURING; NEURAL NETWORKS; OPTIMIZATION; PATTERN RECOGNITION; QUALITY ASSURANCE; TEXTURES; WOOD;

COMPUTER VISION;

EID: 0029714979     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)