Machine vision inspection of technical ceramics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2665, Issue , 1996, Pages 253-257

  Patek, David R ^a   Tobin Jr , Kenneth W ^a   Jachter, L ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BLEMISHES; BLISTERS; BURRS; COORS CERAMICS COMPANY; DENTS; EDGE CHIPS; PITS; RIDGES;

CERAMIC MATERIALS; CONTAMINATION; CRACKS; DEFECTS; IMAGE PROCESSING; INSPECTION; PARALLEL PROCESSING SYSTEMS; SUBSTRATES; SURFACES;

COMPUTER VISION;

EID: 0029725256     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)