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Volumn 50, Issue , 2002, Pages 189-198

Scanning nonlinear dielectric microscopy -a high resolution tool for observing ferroelectric domains and nano-domain engineering

Author keywords

Ferroelectric data storage; Ferroelectric domain; Higher order nonlinear dielectric microscopy; Scanning nonlinear dielectric microscopy; Three dimensional measurement

Indexed keywords

DIELECTRIC MATERIALS; FERROELECTRICITY; OPTICAL RESOLVING POWER; PERMITTIVITY; POLARIZATION; SINGLE CRYSTALS;

EID: 21044448048     PISSN: 10584587     EISSN: 16078489     Source Type: Journal    
DOI: 10.1080/743817685     Document Type: Article
Times cited : (4)

References (9)
  • 1
    • 33846477349 scopus 로고    scopus 로고
    • Y. Cho, A. Kirihara, and T. Saeki: Denshi Joho Tsushin Gakkai Ronbunshi J78-C-1 (1995) 593. [in Japanese].
    • Y. Cho, A. Kirihara, and T. Saeki: Denshi Joho Tsushin Gakkai Ronbunshi J78-C-1 (1995) 593. [in Japanese].


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.