Robustness of nanotube electronic transport to conformational deformations

Applied Physics Letters

Volumn 86, Issue 9, 2005, Pages 1-3

  Leonard F ^a   Jones, F E ^a   Talin, A A ^a   Dentinger, P M ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONFORMATIONAL DEFECTS; ELECTRON ENERGY; EXTREME ULTRAVIOLET LITHOGRAPHY (EUVL); STRAIN ENERGY;

CARBON NANOTUBES; CONFORMATIONS; DEFORMATION; ELECTRIC CONDUCTANCE; ELECTRODES; HAMILTONIANS; LITHOGRAPHY; PROBABILITY; QUANTUM THEORY; ROBUSTNESS (CONTROL SYSTEMS); STRAIN; ULTRAVIOLET RADIATION;

ELECTRON TRANSPORT PROPERTIES;

EID: 21044444765     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1873054     Document Type: Article

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