High-Yield Selective Placement of Carbon Nanotubes on Pre-Patterned Electrodes

Nano Letters

Volumn 2, Issue 5, 2002, Pages 443-446

  Lewenstein, Justin C ^a   Burgin, Timothy P ^a   Ribayrol, Aline ^b   Nagahara, Larry A ^a   Tsui, Raymond K ^a  

^a MOTOROLA INC   (United States)

^b Espace Technologique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000802298     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl015690z     Document Type: Article

References (14)

1. Carbon Nanotubes: Synthesis, Structure Properties and Applications; Dresselhaus, M., Dresselhaus, G., Avouris, P., Eds.; Springer-Verlag: Berlin, 2001.
2. Burghard, M.; Duesberg, G. S.; Philipp, G.; Muster, J.; Roth, S. Adv. Materials 1998, 10, 584.
3. Liu, J.; Casavant, M. J.; Cox, M.; Walters, D. A.; Boul, P.; Lu, W.; Rimberg, A. J.; Smith, K. A.; Colbert, D. T.; Smalley, R. E. Chem. Phys. Lett. 1999, 303, 125.
4. Ahlskog, M.; Seynaeve, E.; Vullers, R. J. M.; Van Haesendonck, C. J. Appl. Phys. 1999, 85, 8432.
5. Choi, K. H.; Bourgoin, J. P.; Auvray, S.; Esteve, D.; Duesberg, G. S.; Roth, S.; Burghard, M. Surface Science 2000, 462, 195.
6. Utilizing PMMA required the use of an aqueous solution of (aminopropyl)triethoxysilane to form the APS SAM because it is incompatible with the organic solvents typically used.
7. Liu, J.; Rinzler, A. G.; Dai, H.; Hafner, J. H.; Bradley, R. K.; Boul, P. J.; Lu, A.; Shelimov, K.; Huffman, C. B.; Rodriguez-Macias, F.; Shon, Y.; Lee, T. R.; Colbert, D. T.; Smalley, R. E. Science 1998, 280, 1253.
8. The SWNTs were purchased from Tubes@Rice, now known as Carbon Nanotechnologies, Inc., Houston, TX.
9. Postdeposition annealing was typically required to completely remove the residue present after liftoff with hot acetone.
10. Due to the very high resolution needed to image SWNTs by AFM, we saw a large increase in the frequency at which an AFM tip needs to be changed, with some tips lasting only for a few scans before loosing the necessary resolution. CNT-AFM tips, such as those described by Choi, N.; Uchihashi, T.; Nishijima, H.; Ishida, T.; Mizutani, W.; Akita, S.; Nakayama, Y.; Ishikawa, M.; Tokumoto, H. Jpn. J. Appl. Phys. 2000, 39, 3707, might be useful for imaging these types of samples.
11. Burgin, T.; Lewenstein, J.; Tsui, R.; et al., future publication.
12. Yao, Z.; Postma, H.; Balents, L.; Dekker, C. Nature 1999, 402, 273.
13. Bezryadin, A.; Verschueren, A. R. M.; Tans, S. J.; Dekker, C. Phys. Rev. Lett. 1998, 80, 4036.
14. With the current window dimensions, multiple SWNTs (2-3) were typically present between a given pair electrically connected electrodes. The 100 KΩ value was determined form a measurement of two SWNTs (or small bundles) in parallel having a total resistance of <50 KΩ.