|
Volumn 546, Issue 3, 2005, Pages 544-552
|
Proton irradiation of e2v technologies L3Vision devices
|
Author keywords
CCD; Charge coupled device; L3Vision; Proton irradiation; Radiation damage
|
Indexed keywords
CHARGE COUPLED DEVICES;
CHARGE TRANSFER;
ELECTRODES;
FAILURE ANALYSIS;
LEAKAGE CURRENTS;
PHOTONS;
RADIATION DAMAGE;
STATISTICAL METHODS;
EUROPEAN SPACE AGENCY;
FRAME TRANSFER DEVICES;
L3VISION DEVICES;
RADIAL VELOCITY SPECTROMETERS (RVS);
PROTON IRRADIATION;
|
EID: 20744441372
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2005.02.035 Document Type: Article |
Times cited : (4)
|
References (14)
|