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Volumn 546, Issue 3, 2005, Pages 544-552

Proton irradiation of e2v technologies L3Vision devices

Author keywords

CCD; Charge coupled device; L3Vision; Proton irradiation; Radiation damage

Indexed keywords

CHARGE COUPLED DEVICES; CHARGE TRANSFER; ELECTRODES; FAILURE ANALYSIS; LEAKAGE CURRENTS; PHOTONS; RADIATION DAMAGE; STATISTICAL METHODS;

EID: 20744441372     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.02.035     Document Type: Article
Times cited : (4)

References (14)
  • 4
    • 20744449997 scopus 로고    scopus 로고
    • GAIA radiation analysis: Cornerstone launch in 2010, 6 yr extended mission
    • esa/estec/ema/he/GAIA/3b
    • H. Evans, GAIA radiation analysis: cornerstone launch in 2010, 6 yr extended mission, ESA Report, esa/estec/ema/he/GAIA/3b, 2003.
    • (2003) ESA Report
    • Evans, H.1
  • 14
    • 20744447377 scopus 로고
    • The irradiation, measurement and technology evaluation of X-ray sensitive CCDs for ESA scientific missions
    • Brunel University, Uxbridge, UB8 3PH, UK
    • A.G. Holmes-Siedle, S.J. Watts, A.D. Holland, The irradiation, measurement and technology evaluation of X-ray sensitive CCDs for ESA scientific missions, Final Report on ESTEC Contract No. 8815/90/NL/LC(SC), Brunel University, Uxbridge, UB8 3PH, UK, 1995.
    • (1995) Final Report on ESTEC Contract No. 8815/90/NL/LC(SC)
    • Holmes-Siedle, A.G.1    Watts, S.J.2    Holland, A.D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.