The effect of protons on E2V Technologies L3Vision CCDs

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 513, Issue 1-2 SPEC. ISS., 2003, Pages 296-299

  Smith, D R ^a   Holland, A D ^a   Robbins, M S ^b  

^a UNIVERSITY OF LEICESTER   (United Kingdom)

^b E2V TECHNOLOGIES   (United Kingdom)

Author keywords

Charge coupled device; Damage; L3Vision; Low light level; Proton; Radiation

Indexed keywords

PROTON IRRADIATION; PROTONS; RADIATION DAMAGE;

SPACE-BASED APPLICATIONS;

CHARGE COUPLED DEVICES;

EID: 0142216435     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.08.051     Document Type: Conference Paper

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