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Volumn 2003-January, Issue , 2003, Pages 519-523

Thermal and thermomechanical study of micro-refrigerators on a chip based on semiconductor heterostructures

Author keywords

Cooling; Optical buffering; Optical devices; Optical films; Optical interferometry; Substrates; Temperature; Thermal resistance; Thermomechanical processes; Thermoreflectance

Indexed keywords

ATMOSPHERIC TEMPERATURE; COOLING; COOLING SYSTEMS; HEAT RESISTANCE; INTERFEROMETRY; JOULE HEATING; OPTICAL DEVICES; OPTICAL FILMS; PELTIER EFFECT; REFRIGERATORS; TEMPERATURE; THERMOELECTRIC EQUIPMENT; THERMOELECTRICITY;

EID: 40449132015     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICT.2003.1287563     Document Type: Conference Paper
Times cited : (8)

References (14)
  • 3
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    • Koga, T.1
  • 9
    • 0035848222 scopus 로고    scopus 로고
    • X. Fan et al, Appl. Phys. Lett., Vol. 78(2001), pp. 1580-1582.
    • (2001) Appl. Phys. Lett. , vol.78 , pp. 1580-1582
    • Fan, X.1
  • 11
    • 0037143927 scopus 로고    scopus 로고
    • Surface displacement imaging by interferometry with a light emitting diode
    • S. Dilhaire et al, "Surface displacement imaging by interferometry with a light emitting diode", Applied Optics, Vol. 41, No.24 (2002), pp. 4996-5001.
    • (2002) Applied Optics , vol.41 , Issue.24 , pp. 4996-5001
    • Dilhaire, S.1
  • 12
    • 0035480218 scopus 로고    scopus 로고
    • Laser Probes for the Thermal and Thermomechanical Characterisation of Microelectronic Devices
    • W. Claeys et al, "Laser Probes for the Thermal and Thermomechanical Characterisation of Microelectronic Devices", Microelectronics Journal, Vol. 32(2001), pp. 891-898.
    • (2001) Microelectronics Journal , vol.32 , pp. 891-898
    • Claeys, W.1
  • 13
    • 0033145395 scopus 로고    scopus 로고
    • Optical method for the measurement of the thermomechanical behaviour of running electronic devices
    • S. Dilhaire et al, "Optical method for the measurement of the thermomechanical behaviour of running electronic devices", Microelectronics reliability, Vol 39(1999), pp. 981-985.
    • (1999) Microelectronics Reliability , vol.39 , pp. 981-985
    • Dilhaire, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.