Broadband complex permeability characterization of magnetic thin films using shorted microstrip transmission-line perturbation

Review of Scientific Instruments

Volumn 76, Issue 6, 2005, Pages

  Liu, Yan ^a   Chen, Linfeng ^a   Tan, C Y ^a   Liu, H J ^a   Ong, C K ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH-SPEED ELECTRONICS; MICROWAVE FREQUENCIES; PICK-UP COIL METHODS; SILICON SUBSTRATES;

ELECTRIC LINES; ELECTROMAGNETIC COMPATIBILITY; FERROMAGNETIC RESONANCE; MAGNETIC PERMEABILITY; MICROWAVES; PERTURBATION TECHNIQUES; SHORT CIRCUIT CURRENTS; SILICON; SUBSTRATES;

MAGNETIC THIN FILMS;

EID: 20544449488     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1935429     Document Type: Article

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