A method to measure the complex permeability of thin films at ultra-high frequencies

IEEE Transactions on Magnetics

Volumn 32, Issue 5 PART 2, 1996, Pages 4905-4907

  Korenivski, V ^a   Van Dover, R B ^a   Mankiewich, P M ^a   Ma, Z X ^a   Becker, A J ^a   Polakos, P A ^a   Fratello, V J ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER CONTROL; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC NETWORK ANALYZERS; ELECTRIC RESISTANCE MEASUREMENT; INDUCTANCE MEASUREMENT; MAGNETIC FIELDS; MAGNETIC HEADS; MAGNETIC THIN FILMS; MICROWAVE DEVICES; NATURAL FREQUENCIES;

HELMHOLTZ COIL; IMPEDANCE ANALYZER; MICROWAVE COMPONENTS; RECORDING HEADS; STRIP LOOP DEVICE; SWEPT FREQUENCY METHOD;

MAGNETIC PERMEABILITY;

EID: 0030247394     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.539283     Document Type: Article

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