Surface permeameter for nondestructive measurement of the rf complex permeability spectra of thin surface coatings

Review of Scientific Instruments

Volumn 67, Issue 12, 1996, Pages 4311-4313

  Grimes, Craig A ^a  

^a UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009055291     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147531     Document Type: Article

References (16)

1. S. P. Maxwell, Microw. J. 99 (1966).
2. G. G. Bush, IEEE Trans. Magn. 25, 4222 (1989).
3. R. B. Goldfarb and H. E. Bussey, Rev. Sci. Instrum. 58, 624 (1987).
4. G. G. Bush, J. Appl. Phys. 63, 3765 (1988).
5. K. Kawakami, S. Narishige, and M. Takagi, IEEE Trans. Magn. 19, 2154 (1983).
6. C. A. Grimes, P. L. Trouilloid, and R. M. Walser, IEEE Trans. Magn. 24, 603 (1988).
7. E. R. Fearon and R. E. Fearon, European Patent No. 0232584; C. Plonsky, U.S. Patent No. 5049857.
8. E. R. Fearon and R. E. Fearon, European Patent No. 0232584; C. Plonsky, U.S. Patent No. 5049857.
9. G. Lewis, Selection of Engineering Materials (Prentice-Hall, Englewood Cliffs, NJ, 1990), p. 25.
10. Handbook of Shipboard Electromagnetic Shielding Practices, NAVSEA, S9407, Revision I, Secs. 6 and 7, U.S. Government Printing Office (1989).
11. H. J. Oguey, Rev. Sci. Instrum. 31, 701 (1960).
12. K. P. Ash and D. Wachenschwanz, IEEE Trans. Magn. 26, 2960 (1990).
13. M. A. Russak and C. V. Jahnes, IEEE Trans. Magn. 26, 2332 (1990).
14. B. C. Webb, M. E. Re, and C. V. Jahnes, J. Appl. Phys. 69, 5611 (1991).
15. R. M. Walser, Ph.D. dissertation, University of Michigan, 1967.
16. C. A. Grimes, IEEE Trans. Magn. 31, 4109 (1995).