An improved permeameter for thin film measurements up to 6 GHz

Journal of Applied Physics

Volumn 85, Issue 8 II A, 1999, Pages 5151-5153

  Pain, D ^a   Ledieu, M ^a   Acher, O ^a   Adenot, A L ^a   Duverger, F ^a  

^a DIF   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000620317     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369107     Document Type: Article

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