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Volumn 97, Issue 11, 2005, Pages
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Characterization of AlGaNGaN p-n diodes with selectively regrown n -AlGaN by metal-organic chemical-vapor deposition and its application to GaN-based bipolar transistors
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT GAINS;
MEMORY EFFECTS;
P-N DIODES;
SECONDARY-ION-MASS SPECTROMETRY (SIMS);
BIPOLAR TRANSISTORS;
CHARACTERIZATION;
CHEMICAL VAPOR DEPOSITION;
GAIN CONTROL;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTOR DIODES;
SEMICONDUCTOR JUNCTIONS;
SEMICONDUCTING ALUMINUM COMPOUNDS;
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EID: 20544438805
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1914952 Document Type: Article |
Times cited : (20)
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References (15)
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