Fatigue-free behavior of Bi3.25 La0.75 Ti 3O12 thin films grown on several bottom eletrodes by the polymeric precursor method

Applied Physics Letters

Volumn 85, Issue 24, 2004, Pages 5962-5964

  Simoes A Z ^a   Ries, A ^a   Filho, F M ^a   Riccardi, C S ^a   Varela, J A ^a   Longo, E ^b  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^b FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRODES; FATIGUE OF MATERIALS; MICROWAVES; REMANENCE; SEMICONDUCTING BISMUTH COMPOUNDS; THIN FILMS;

CONDUCTIVE OXIDES; DRIVE VOLTAGE; PHASE ANALYSIS; POLYMERIC PRECURSOR METHODS;

FILM GROWTH;

EID: 20444496929     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1834999     Document Type: Article

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