Investigation of BZT thin films for tunable microwave applications

Journal of the European Ceramic Society

Volumn 25, Issue 12 SPEC. ISS., 2005, Pages 2289-2293

  Xu, Jin ^a   Menesklou, Wolfgang ^a   Ivers Tiffée, Ellen ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

BaTiO3 and titanate; Dielectric properties; Films; Tunable applications

Indexed keywords

ANNEALING; CAPACITORS; CERAMIC MATERIALS; DIELECTRIC PROPERTIES; ELECTRIC FIELDS; MAGNESIA; MAGNETRON SPUTTERING; MICROWAVES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

BZT THIN FILMS; CRYSTALLINITY; MICROWAVE APPLICATIONS; RUTHERFORD BACKSCATTERING (RBS);

BARIUM COMPOUNDS;

FILM;

EID: 20444469270     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2005.03.048     Document Type: Article

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