SCOPUS 정보 검색 플랫폼

Journal of the European Ceramic Society

Volumn 24, Issue 6, 2004, Pages 1735-1739

Processing and properties of BST thin films for tunable microwave devices

(3) Xu, Jin a Menesklou, Wolfgang a Ivers Tiffée, Ellen a

a UNIVERSITY OF KARLSRUHE (Germany)

Author keywords

BaTiO3 and titanates; Dielectric properties; RF magnetron sputtering; Thin films

Indexed keywords

CRYSTALLINE MATERIALS; DIELECTRIC MATERIALS; MICROWAVE DEVICES; MORPHOLOGY; PEROVSKITE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; TUNING; X RAY DIFFRACTION ANALYSIS;

DIELECTRIC MEASUREMENTS;

BARIUM COMPOUNDS;

DIELECTRIC PROPERTY; FILM THICKNESS; MICROWAVE RADIATION; PROCESSING TECHNIQUE; SPUTTERING;

EID: 0942301925 PISSN: 09552219 EISSN: None Source Type: Journal
DOI: 10.1016/S0955-2219(03)00485-0 Document Type: Article

Times cited : (58)

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