Stretched exponential behavior of degradation in oxide cathodes

IVESC2004 - 5th International Vacuum Electron Sources Conference Proceedings

Volumn , Issue , 2004, Pages 100-103

  Weon, Byung Mook ^a   Je, Jung Ho ^b  

^a Product and Process Development   (Netherlands)

^b Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Complex systems; Degradation; Oxide cathodes; Stretched exponential; Thermionic emission

Indexed keywords

CATHODE RAY TUBES; DEGRADATION; ELECTROLUMINESCENCE; ELECTRON SOURCES; LARGE SCALE SYSTEMS; MATHEMATICAL MODELS; OXIDES; POROSITY; STATISTICAL METHODS; THERMIONIC EMISSION;

ACTIVATION PROCESS; CATHODE STRUCTURE; OXIDE CATHODES; STRETCHED EXPONENTIAL;

FIELD EMISSION CATHODES;

EID: 20444427276     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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