Preliminary results on the chemical characterisation of the cathode nickel - Emissive layer interface in oxide cathodes

Applied Surface Science

Volumn 215, Issue 1-4 SPEC., 2003, Pages 78-86

  Jenkins, S N ^a   Barber, D K ^b   Whiting, M J ^b   Baker, M A ^b  

^a LG Philips Displays   (United Kingdom)

^b UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

AES; CRT; EDX; Interface; Sample preparation; SEM; sSIMS; Surface analysis; Thermionic oxide cathode

Indexed keywords

BARIUM COMPOUNDS; ELECTRON EMISSION; INTERFACES (MATERIALS); NICKEL ALLOYS; SCANNING ELECTRON MICROSCOPY;

SAMPLE PREPARATION;

THERMIONIC CATHODES;

EID: 0037672596     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00278-2     Document Type: Conference Paper

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