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Volumn 215, Issue 1-4 SPEC., 2003, Pages 72-77

Accelerated life tests of CRT oxide cathodes

Author keywords

Accelerated life tests; Critical dc current density; Emission poisoning; Oxide cathodes; Thermionic emission

Indexed keywords

CURRENT DENSITY; OXIDES; THERMIONIC EMISSION;

EID: 0038010465     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00282-4     Document Type: Conference Paper
Times cited : (21)

References (17)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.