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Volumn 280, Issue 3-4, 2005, Pages 352-356
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Properties of Si-rich SiO2 films by RF magnetron sputtering
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Author keywords
A1. Low dimensional structures; A3. Physical vapor deposition process; B1. Nanomaterials; B2. Semiconducting materials
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Indexed keywords
AMORPHOUS MATERIALS;
LIGHT EMITTING DIODES;
MAGNETRON SPUTTERING;
NANOSTRUCTURED MATERIALS;
PHOTOLUMINESCENCE;
PHYSICAL VAPOR DEPOSITION;
SCANNING ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
LOW-DIMENSIONAL STRUCTURES;
NANOMATERIALS;
PHYSICAL VAPOR DEPOSITION PROCESS;
SEMICONDUCTING MATERIALS;
SILICA;
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EID: 20344403550
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2005.03.081 Document Type: Article |
Times cited : (17)
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References (15)
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