메뉴 건너뛰기




Volumn 280, Issue 3-4, 2005, Pages 352-356

Properties of Si-rich SiO2 films by RF magnetron sputtering

Author keywords

A1. Low dimensional structures; A3. Physical vapor deposition process; B1. Nanomaterials; B2. Semiconducting materials

Indexed keywords

AMORPHOUS MATERIALS; LIGHT EMITTING DIODES; MAGNETRON SPUTTERING; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; PHYSICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 20344403550     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.03.081     Document Type: Article
Times cited : (17)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.