Fault injection into SRAM-based FPGAs for the analysis of SEU effects

Proceedings - 2003 IEEE International Conference on Field-Programmable Technology, FPT 2003

Volumn , Issue , 2003, Pages 428-430

  Asadi, Ghazanfar ^a   Miremadi, Seyed Ghassem ^a   Zarandi, Hamid Reza ^a   Ejlali, Alireza ^a  

^a SHARIF UNIVERSITY OF TECHNOLOGY   (Iran)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER CONTROL SYSTEMS; HEAVY IONS; RADIATION HARDENING; SOFTWARE TESTING; SPACE APPLICATIONS;

BENCHMARK CIRCUIT; ERROR PROPAGATION; FAULT INJECTION; FPGA DEVICES; HIGH AVAILABILITY; ION RADIATION; SINGLE EVENT UPSETS; SRAM-BASED FPGA;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

EID: 20344393536     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FPT.2003.1275794     Document Type: Conference Paper

References (11)

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