Development of scalable models for patterned-ground-shield inductors in SiGe BiCMOS technology

2004 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems: Digest of Papers

Volumn , Issue , 2004, Pages 211-214

  Svitek, Richard ^a   Klein, Adam S ^b   Clifford, Michael ^c   Raman, Sanjay ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^b Exxim Computing Corporation   (United States)

^c FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GROUND SHIELDS; INDUCTOR WINDINGS; ON-WAFER MEASUREMENT; QUALITY FACTOR;

DIFFUSION; ELECTRIC INDUCTORS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; POLYSILICON; SILICON COMPOUNDS; SUBSTRATES;

CMOS INTEGRATED CIRCUITS;

EID: 20344374138     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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