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Volumn 86, Issue 8, 2005, Pages 1-3

Type I-type II transition in InGaAs-GaNAs heterostructures

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; EQUATIONS OF MOTION; LASERS; LIGHT POLARIZATION; OPTICAL COMMUNICATION; PHOTOLUMINESCENCE; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS;

EID: 20144389799     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1870132     Document Type: Article
Times cited : (15)

References (24)
  • 1
    • 5544310137 scopus 로고    scopus 로고
    • III-N-V semiconductor alloys
    • Semicond. Sci. Technol. 17, special issue: " III-N-V Semiconductor Alloys. " (2002).
    • (2002) Semicond. Sci. Technol. , vol.17
  • 2
    • 0037304561 scopus 로고    scopus 로고
    • Physics and technology of dilute nitrides for optical communications
    • IEE Proc.: Optoelectron. 150, special issue: " Physics and Technology of Dilute Nitrides for Optical Communications. " (2003).
    • (2003) IEE Proc.: Optoelectron. , vol.150
  • 3
    • 33646569884 scopus 로고    scopus 로고
    • Articles on dilute nitrides
    • J. Phys.: Condens. Matter 16, special issue: " Articles on Dilute Nitrides. " (2004).
    • (2004) J. Phys.: Condens. Matter , vol.16
  • 6
    • 3743096987 scopus 로고
    • 1967 International Conference, edited by D. G.Thomas (W. A. Benjamin, Inc., New York
    • E. Y. Wang, W. A. Albers, Jr., and C. E. Bleil, in II-VI Semiconducting Compounds, 1967 International Conference, edited by, D. G. Thomas, (W. A. Benjamin, Inc., New York, 1967).
    • (1967) II-VI Semiconducting Compounds
    • Wang, E.Y.1    Albers Jr., W.A.2    Bleil, C.E.3
  • 9
    • 0042011199 scopus 로고    scopus 로고
    • 0021-8979 10.1063/1.1591078
    • M. Hetterich, A. Grau, A. Yu. Egorov, and H. Riechert, J. Appl. Phys. 0021-8979 10.1063/1.1591078 94, 1810 (2003); M. Hetterich, A. Grau, A. Yu. Egorov, and H. Riechert, J. Phys.: Condens. Matter 16, S3151 (2004).
    • (2003) J. Appl. Phys. , vol.94 , pp. 1810
    • Hetterich, M.1    Grau, A.2    Egorov, A.Yu.3    Riechert, H.4
  • 16
    • 17044378857 scopus 로고    scopus 로고
    • O.Madelung, U.Rössler, and M.Schulz (Springer, Berlin
    • The band structure parameters were taken from Landolt-Börnstein, Vol. 41 A1, Semiconductors: Group IV Elements, IV-IV and III-V Compounds, edited by, O. Madelung, U. Rössler, and, M. Schulz, (Springer, Berlin, 2001/2); and W. W. Chow and S. W. Koch, Semiconductor-Laser Fundamentals (Springer, Berlin, 1999). The N-influence on the gap energy was extracted from experiment. Parameters are similar to Ref.. For the band alignment, 36% of the gap difference Δlayer = Eg,GaAs - Eg,layer are attributed to the valence band and 64% to the conduction band. In case of GaNAs, an offset component x Voff, Voff =1.5 eV, is added to the valence band, to account for the influence of the anticrossing.
    • (2001) Landolt-Börnstein, Vol. 41 A1, Semiconductors: Group IV Elements, IV-IV and III-V Compounds, Edited by
  • 17
    • 0003400088 scopus 로고    scopus 로고
    • Springer, Berlin
    • The band structure parameters were taken from Landolt-Börnstein, Vol. 41 A1, Semiconductors: Group IV Elements, IV-IV and III-V Compounds, edited by, O. Madelung, U. Rössler, and, M. Schulz, (Springer, Berlin, 2001/2); and W. W. Chow and S. W. Koch, Semiconductor-Laser Fundamentals (Springer, Berlin, 1999). The N-influence on the gap energy was extracted from experiment. Parameters are similar to Ref.. For the band alignment, 36% of the gap difference Δlayer = Eg,GaAs - Eg,layer are attributed to the valence band and 64% to the conduction band. In case of GaNAs, an offset component x Voff, Voff =1.5 eV, is added to the valence band, to account for the influence of the anticrossing.
    • (1999) Semiconductor-Laser Fundamentals
    • Chow, W.W.1    Koch, S.W.2
  • 18
    • 17044388866 scopus 로고    scopus 로고
    • The N-influence on the gap energy was extracted from experiment. Parameters are similar to Ref. 16. For the band alignment, 36% of the gap difference Δlayer = Eg,GaAs - Eg,layer are attributed to the valence band and 64% to the conduction band. In case of GaNAs, an offset component x Voff, Voff =1.5 eV, is added to the valence band, to account for the influence of the anticrossing.
    • The band structure parameters were taken from Landolt-Börnstein, Vol. 41 A1, Semiconductors: Group IV Elements, IV-IV and III-V Compounds, edited by, O. Madelung, U. Rössler, and, M. Schulz, (Springer, Berlin, 2001/2); and W. W. Chow and S. W. Koch, Semiconductor-Laser Fundamentals (Springer, Berlin, 1999). The N-influence on the gap energy was extracted from experiment. Parameters are similar to Ref.. For the band alignment, 36% of the gap difference Δlayer = Eg,GaAs - Eg,layer are attributed to the valence band and 64% to the conduction band. In case of GaNAs, an offset component x Voff, Voff =1.5 eV, is added to the valence band, to account for the influence of the anticrossing.


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