-
2
-
-
0035682444
-
-
See, for example, recent reviews by N. Zaitseva and L. Carman, Prog. Cryst. Growth Charact. 43, 1 (2001); J. J. De Yoreo, A. K. Burnham, and P. K. Whitman, Int. Mater. Rev. 47, 113 (2002), and references therein.
-
(2001)
Prog. Cryst. Growth Charact.
, vol.43
, pp. 1
-
-
Zaitseva, N.1
Carman, L.2
-
3
-
-
0036943018
-
-
and references therein
-
See, for example, recent reviews by N. Zaitseva and L. Carman, Prog. Cryst. Growth Charact. 43, 1 (2001); J. J. De Yoreo, A. K. Burnham, and P. K. Whitman, Int. Mater. Rev. 47, 113 (2002), and references therein.
-
(2002)
Int. Mater. Rev.
, vol.47
, pp. 113
-
-
De Yoreo, J.J.1
Burnham, A.K.2
Whitman, P.K.3
-
6
-
-
84956420377
-
-
and references therein
-
R. J. Nelmes, Z. Tun, and W. F. Kuhs, Ferroelectrics 71, 125 (1987), and references therein.
-
(1987)
Ferroelectrics
, vol.71
, pp. 125
-
-
Nelmes, R.J.1
Tun, Z.2
Kuhs, W.F.3
-
7
-
-
1642383059
-
-
W. R. Cook, Jr., J. Appl. Phys. 38, 163 (1967); C. Belouet, M. Monnier, and R. Crouzier, J. Cryst. Growth 30, 151 (1975).
-
(1967)
J. Appl. Phys.
, vol.38
, pp. 163
-
-
Cook Jr., W.R.1
-
8
-
-
0001400563
-
-
W. R. Cook, Jr., J. Appl. Phys. 38, 163 (1967); C. Belouet, M. Monnier, and R. Crouzier, J. Cryst. Growth 30, 151 (1975).
-
(1975)
J. Cryst. Growth
, vol.30
, pp. 151
-
-
Belouet, C.1
Monnier, M.2
Crouzier, R.3
-
9
-
-
0041995948
-
-
S. Koval, J. Kohanoff, R. L. Migoni, and E. Tosatti, Phys. Rev. Lett. 89, 187602 (2002).
-
(2002)
Phys. Rev. Lett.
, vol.89
, pp. 187602
-
-
Koval, S.1
Kohanoff, J.2
Migoni, R.L.3
Tosatti, E.4
-
10
-
-
2142755952
-
-
S. O. Kucheyev, W. J. Siekhaus, T. A. Land, and S. G. Demos, Appl. Phys. Lett. 84, 2274 (2004).
-
(2004)
Appl. Phys. Lett.
, vol.84
, pp. 2274
-
-
Kucheyev, S.O.1
Siekhaus, W.J.2
Land, T.A.3
Demos, S.G.4
-
12
-
-
0000098947
-
-
and references therein
-
K.-S. Lee, J. Phys. Chem. Solids 57, 333 (1996), and references therein.
-
(1996)
J. Phys. Chem. Solids
, vol.57
, pp. 333
-
-
Lee, K.-S.1
-
14
-
-
0011213803
-
-
S. D. Setzler, K. T. Stevens, L. E. Halliburton, M. Yan, N. P. Zaitseva, and J. J. De Yoreo, Phys. Rev. B 57, 2643 (1998).
-
(1998)
Phys. Rev. B
, vol.57
, pp. 2643
-
-
Setzler, S.D.1
Stevens, K.T.2
Halliburton, L.E.3
Yan, M.4
Zaitseva, N.P.5
De Yoreo, J.J.6
-
16
-
-
1642402114
-
-
S. O. Kucheyev, T. E. Felter, W. J. Siekhaus, A. J. Nelson, and A. V. Hamza, Appl. Phys. Lett. 84, 1344 (2004).
-
(2004)
Appl. Phys. Lett.
, vol.84
, pp. 1344
-
-
Kucheyev, S.O.1
Felter, T.E.2
Siekhaus, W.J.3
Nelson, A.J.4
Hamza, A.V.5
-
21
-
-
14944364375
-
-
M. Engelhard, C. Evans, T. A. Land, and A. J. Nelson, Surf. Sci. Spectra 8, 56 (2001).
-
(2001)
Surf. Sci. Spectra
, vol.8
, pp. 56
-
-
Engelhard, M.1
Evans, C.2
Land, T.A.3
Nelson, A.J.4
-
22
-
-
4244145701
-
-
A. J. Nelson, T. van Buuren, E. Miller, T. A. Land, C. Bostedt, N. Franco, P. K. Whitman, P. A. Baisden, L. J. Terminello, and T. A. Callcott, J. Electron Spectrosc. Relat. Phenom. 114, 873 (2001).
-
(2001)
J. Electron Spectrosc. Relat. Phenom.
, vol.114
, pp. 873
-
-
Nelson, A.J.1
Van Buuren, T.2
Miller, E.3
Land, T.A.4
Bostedt, C.5
Franco, N.6
Whitman, P.K.7
Baisden, P.A.8
Terminello, L.J.9
Callcott, T.A.10
-
23
-
-
0141763476
-
-
I. N. Ogorodnikov, V. A. Pustovarov, B. V. Shul'gin, V. T. Kuanyshev, and M. K. Satybaldieva, Opt. Spectrosc. 91, 224 (2001).
-
(2001)
Opt. Spectrosc.
, vol.91
, pp. 224
-
-
Ogorodnikov, I.N.1
Pustovarov, V.A.2
Shul'gin, B.V.3
Kuanyshev, V.T.4
Satybaldieva, M.K.5
-
24
-
-
14944370399
-
-
A. A. Levin, I. S. Fedorova, and A. R. Zaitsev, Russ. J. Inorg. Chem. 32, 782 (1987); 33, 34 (1988).
-
(1987)
Russ. J. Inorg. Chem.
, vol.32
, pp. 782
-
-
Levin, A.A.1
Fedorova, I.S.2
Zaitsev, A.R.3
-
25
-
-
14944339385
-
-
A. A. Levin, I. S. Fedorova, and A. R. Zaitsev, Russ. J. Inorg. Chem. 32, 782 (1987); 33, 34 (1988).
-
(1988)
Russ. J. Inorg. Chem.
, vol.33
, pp. 34
-
-
-
29
-
-
0036140503
-
-
Q. Zhang, F. Chen, N. Kioussis, S. G. Demos, and H. B. Radousky, Phys. Rev. B 65, 024108 (2002).
-
(2002)
Phys. Rev. B
, vol.65
, pp. 024108
-
-
Zhang, Q.1
Chen, F.2
Kioussis, N.3
Demos, S.G.4
Radousky, H.B.5
-
30
-
-
0037324060
-
-
Z. Lin, Z. Wang, C. Chen, and M.-H. Lee, J. Chem. Phys, 118, 2349 (2003).
-
(2003)
J. Chem. Phys
, vol.118
, pp. 2349
-
-
Lin, Z.1
Wang, Z.2
Chen, C.3
Lee, M.-H.4
-
31
-
-
0042709531
-
-
C. S. Liu, N. Kioussis, S. G. Demos, and H. B. Radousky, Phys. Rev. Lett. 91, 015505 (2003).
-
(2003)
Phys. Rev. Lett.
, vol.91
, pp. 015505
-
-
Liu, C.S.1
Kioussis, N.2
Demos, S.G.3
Radousky, H.B.4
-
33
-
-
0003672558
-
-
edited by R. Gomer (Springer-Verlag, Berlin)
-
A. Meisel, G. Leonhardt, and R. Szargan, in X-ray Spectra and Chemical Binding, edited by R. Gomer (Springer-Verlag, Berlin, 1989).
-
(1989)
X-ray Spectra and Chemical Binding
-
-
Meisel, A.1
Leonhardt, G.2
Szargan, R.3
-
34
-
-
85088490177
-
-
note
-
2O polishing.
-
-
-
-
35
-
-
0029247488
-
-
J. J. Jia, T. A. Callcott, J. Yurkas, A. W. Ellis, F. J. Himpsel, M. G. Samant, J. Stohr, D. L. Ederer, J. A. Carlisle, E. A. Hudson, L. J. Terminello, D. K. Shuh, and R. C. C. Perera, Rev. Sci. Instrum. 66, 1394 (1995).
-
(1995)
Rev. Sci. Instrum.
, vol.66
, pp. 1394
-
-
Jia, J.J.1
Callcott, T.A.2
Yurkas, J.3
Ellis, A.W.4
Himpsel, F.J.5
Samant, M.G.6
Stohr, J.7
Ederer, D.L.8
Carlisle, J.A.9
Hudson, E.A.10
Terminello, L.J.11
Shuh, D.K.12
Perera, R.C.C.13
-
36
-
-
85088490120
-
-
note
-
2,3-edge (∼300 eV) rather than for O K-edge (∼540 eV) XANES spectra can be attributed to (i) smaller energies of ejected photoelectrons and (ii) a larger photoelectron cross section for the case of excitation with lower energy photons.
-
-
-
-
38
-
-
33750443381
-
-
R. Brydson, H. Sauer, W. Engel, J. M. Thomas, E. Zeitler, N. Kosugi, and H. Kuroda, J. Phys.: Condens. Matter 1, 797 (1989).
-
(1989)
J. Phys.: Condens. Matter
, vol.1
, pp. 797
-
-
Brydson, R.1
Sauer, H.2
Engel, W.3
Thomas, J.M.4
Zeitler, E.5
Kosugi, N.6
Kuroda, H.7
-
39
-
-
14944359851
-
-
note
-
It should be noted that XANES has a relatively poor sensitivity to defect-induced electronic states as compared to some other analytical techniques. Indeed, while techniques such as photoluminescence and cathodoluminescence and electrical characterization are sensitive to concentrations of (optically or electrically) active defects comparable to the concentration of free carriers, XANES is sensitive to concentrations of defect-related densities of states (in the volume probed) comparable to the atomic concentration in the material (i. e., when the density of defect-related electronic states is roughly comparable to the density of states in the conduction band). However, a quantitative evaluation of XANES sensitivity to defect-related states is not straightforward and is beyond the scope of this work.
-
-
-
-
41
-
-
14944350703
-
-
note
-
We have observed relatively strong C-related absorption peaks in TFY spectra in all the KDP and DKDP samples studied in this work after different surface preparation conditions (such as water polishing on different lens paper, etching in water-ethanol solutions, and sample cleavage [in air]). Our detailed study of C impurities, unintentionally introduced into KDP and DKDP during crystal growth, with possible implications to the performance of KDP and DKDP as optical materials, will be reported separately.
-
-
-
-
42
-
-
0001264967
-
-
D. G. J. Sutherland, M. Kasrai, G. M. Bancroft, Z. F. Liu, and K. H. Tan, Phys. Rev. B 48, 14 989 (1993).
-
(1993)
Phys. Rev. B
, vol.48
, pp. 14989
-
-
Sutherland, D.G.J.1
Kasrai, M.2
Bancroft, G.M.3
Liu, Z.F.4
Tan, K.H.5
-
44
-
-
0000412148
-
-
See, for example, Z. Y. Wu, F. Jollet, and F. Seifert, J. Phys.: Condens. Matter 10, 8083 (1998); L. A. G. Garvie, P. Rez, J. R. Alvarez, P. R. Buseck, A. J. Craven, and R. Brydson, Am. Mineral. 85, 732 (2000), and references therein.
-
(1998)
J. Phys.: Condens. Matter
, vol.10
, pp. 8083
-
-
Wu, Z.Y.1
Jollet, F.2
Seifert, F.3
-
45
-
-
0034048048
-
-
and references therein
-
See, for example, Z. Y. Wu, F. Jollet, and F. Seifert, J. Phys.: Condens. Matter 10, 8083 (1998); L. A. G. Garvie, P. Rez, J. R. Alvarez, P. R. Buseck, A. J. Craven, and R. Brydson, Am. Mineral. 85, 732 (2000), and references therein.
-
(2000)
Am. Mineral
, vol.85
, pp. 732
-
-
Garvie, L.A.G.1
Rez, P.2
Alvarez, J.R.3
Buseck, P.R.4
Craven, A.J.5
Brydson, R.6
-
46
-
-
0000456248
-
-
Z. Yin, M. Kasrai, G. M. Bancroft, K. H. Tan, and X. Feng, Phys. Rev. B 51, 742 (1995).
-
(1995)
Phys. Rev. B
, vol.51
, pp. 742
-
-
Yin, Z.1
Kasrai, M.2
Bancroft, G.M.3
Tan, K.H.4
Feng, X.5
-
47
-
-
0000580685
-
-
See, for example, H. P. Hjalmarson, H. Büttner, and J. D. Dow, Phys. Rev. B 24, 6010 (1981).
-
(1981)
Phys. Rev. B
, vol.24
, pp. 6010
-
-
Hjalmarson, H.P.1
Büttner, H.2
Dow, J.D.3
-
48
-
-
0001088023
-
-
See, for example, F. J. Himpsel, U. O. Karlsson, A. B. McLean, L. J. Terminello, F. M. F. de Groot, M. Abbate, J. C. Fuggle, J. A. Yarmoff, B. T. Thole, and G. A. Sawatzky, Phys. Rev. B 43, 6899 (1991).
-
(1991)
Phys. Rev. B
, vol.43
, pp. 6899
-
-
Himpsel, F.J.1
Karlsson, U.O.2
McLean, A.B.3
Terminello, L.J.4
De Groot, F.M.F.5
Abbate, M.6
Fuggle, J.C.7
Yarmoff, J.A.8
Thole, B.T.9
Sawatzky, G.A.10
-
49
-
-
0005022606
-
-
F. Sette, B. Sinkovic, Y. J. Ma, and C. T. Chen, Phys. Rev. B 39, 11 125 (1989).
-
(1989)
Phys. Rev. B
, vol.39
, pp. 11125
-
-
Sette, F.1
Sinkovic, B.2
Ma, Y.J.3
Chen, C.T.4
-
50
-
-
0001387387
-
-
F. M. F. de Groot, J. C. Fuggle, B. T. Thole, and G. A. Sawatzky, Phys. Rev. B 41, 928 (1990).
-
(1990)
Phys. Rev. B
, vol.41
, pp. 928
-
-
De Groot, F.M.F.1
Fuggle, J.C.2
Thole, B.T.3
Sawatzky, G.A.4
-
51
-
-
0030566503
-
-
I. Smolski, J. J. De Yoreo, N. P. Zaitseva, J. D. Lee, T. A. Land, and E. B. Rudneva, J. Cryst. Growth 169, 741 (1996).
-
(1996)
J. Cryst. Growth
, vol.169
, pp. 741
-
-
Smolski, I.1
De Yoreo, J.J.2
Zaitseva, N.P.3
Lee, J.D.4
Land, T.A.5
Rudneva, E.B.6
-
52
-
-
0036751886
-
-
U. Bergmann, Ph. Wernet, P. Glatzel, M. Cavalleri, L. G. M. Pettersson, A. Nilsson, and S. P. Cramer, Phys. Rev. B 66, 092107 (2002).
-
(2002)
Phys. Rev. B
, vol.66
, pp. 092107
-
-
Bergmann, U.1
Wernet, Ph.2
Glatzel, P.3
Cavalleri, M.4
Pettersson, L.G.M.5
Nilsson, A.6
Cramer, S.P.7
-
53
-
-
0037115932
-
-
Ph. Parent, C. Laffon, C. Mangeney, F. Bournel, and M. Tronc, J. Chem. Phys. 117, 10 842 (2002).
-
(2002)
J. Chem. Phys.
, vol.117
, pp. 10842
-
-
Parent, Ph.1
Laffon, C.2
Mangeney, C.3
Bournel, F.4
Tronc, M.5
-
55
-
-
0000559486
-
-
Z. Yin, M. Kasrai, M. Fuller, G. M. Bancroft, K. Fyfe, and K. H. Tan, Wear 202, 172 (1997).
-
(1997)
Wear
, vol.202
, pp. 172
-
-
Yin, Z.1
Kasrai, M.2
Fuller, M.3
Bancroft, G.M.4
Fyfe, K.5
Tan, K.H.6
-
56
-
-
85088488169
-
-
note
-
2.3 XES spectra for excitation photon energies above 536 and 139 eV, respectively.
-
-
-
-
58
-
-
4644333512
-
-
C. W. Carr, H. B. Radousky, A. M. Rubenchik, M. D. Feit, and S. G. Demos, Phys. Rev. Lett. 92, 087401 (2004).
-
(2004)
Phys. Rev. Lett.
, vol.92
, pp. 087401
-
-
Carr, C.W.1
Radousky, H.B.2
Rubenchik, A.M.3
Feit, M.D.4
Demos, S.G.5
-
59
-
-
14944377371
-
-
note
-
The room-temperature band gap value of 8.4 eV, quoted in Ref. 54, was taken from a paper by Ogorodnikov et al. (Ref. 21), where the estimation of the band gap was given for 7 K (not for 300 K). Hence, we consider the room-temperature band gap value (of 8.4 eV) quoted by Carr et al. (Ref. 54) as a misquotation.
-
-
-
-
61
-
-
0000666402
-
-
C. B. Stagarescu, L.-C. Duda, K. E. Smith, J. H. Guo, J. Nordgren, R. Singh, and T. D. Moustakas, Phys. Rev. B 54, R17 335 (1996).
-
(1996)
Phys. Rev. B
, vol.54
-
-
Stagarescu, C.B.1
Duda, L.-C.2
Smith, K.E.3
Guo, J.H.4
Nordgren, J.5
Singh, R.6
Moustakas, T.D.7
-
62
-
-
0001534567
-
-
J. Lüning, S. Eisebitt, J.-E. Rubensson, C. Ellmers, and W. Eberhardt, Phys. Rev. B 59, 10573 (1999).
-
(1999)
Phys. Rev. B
, vol.59
, pp. 10573
-
-
Lüning, J.1
Eisebitt, S.2
Rubensson, J.-E.3
Ellmers, C.4
Eberhardt, W.5
-
63
-
-
4043088863
-
-
J. Wu, W. Walukiewicz, K. M. Yu, J. W Ager III, E. E. Haller, I. Miotkowski, A. K. Ramdas, C.-H. Su, I. K. Sou, R. C. C. Perera, and J. D. Denlinger, Phys. Rev. B 67, 035207 (2003).
-
(2003)
Phys. Rev. B
, vol.67
, pp. 035207
-
-
Wu, J.1
Walukiewicz, W.2
Yu, K.M.3
Ager III, J.W.4
Haller, E.E.5
Miotkowski, I.6
Ramdas, A.K.7
Su, C.-H.8
Sou, I.K.9
Perera, R.C.C.10
Denlinger, J.D.11
-
64
-
-
85088492017
-
-
note
-
2,3 edges, respectively). For such excitation energies, XES spectra exhibit smaller high energy tails, facilitating estimation of the valence band maximum.
-
-
-
-
65
-
-
14944349224
-
-
note
-
Note that, due to element and angular momentum selectivity of XANES and XES, such an estimate can also give a higher value than the optical band gap in cases when the states probed by XANES and XES do not contribute to the band edges.
-
-
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