X-ray absorption analysis of KDP optics

Journal of Electron Spectroscopy and Related Phenomena

Volumn 114-116, Issue , 2001, Pages 873-878

  Nelson, A J ^a   Van Buuren, T ^a   Miller, Eric ^a   Land, T A ^a   Bostedt, C ^a   Franco, N ^a   Whitman, P K ^a   Baisden, P A ^a   Terminello, L J ^a   Callcott, T A ^b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF TENNESSEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ANNEALING; ANTIREFLECTION COATINGS; COMPOSITION EFFECTS; CRYSTALS; SENSITIVITY ANALYSIS; SILICA; X RAY SPECTROSCOPY;

POTASSIUM DIHYDROGEN PHOSPHATES; X RAY ABSORPTION ANALYSIS;

PHOSPHATES;

EID: 4244145701     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(00)00267-X     Document Type: Article

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