Degradation of organic field-effect transistors made of pentacene

Journal of Materials Research

Volumn 19, Issue 7, 2004, Pages 1999-2002

  Pannemann, Ch ^a   Diekmann, T ^a   Hilleringmann, U ^a  

^a UNIVERSITY OF PADERBORN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER MOBILITY; DEGRADATION; DIELECTRIC MATERIALS; ELECTRIC CURRENTS; FIELD EFFECT TRANSISTORS; HEAT TREATMENT; SILICA; SILICON WAFERS; THERMAL EFFECTS; THIN FILM TRANSISTORS; THRESHOLD VOLTAGE;

FIELD EFFECT MOBILITY; GATE DIELECTRIC; ORGANIC THIN FIL TRANSISTORS; PENTACENE;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 4143091519     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2004.0267     Document Type: Article

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